Experimental Optimization of Annular Polishing Parameters for Silicon Carbide
نویسندگان
چکیده
منابع مشابه
Sub-Surface Damage Removal in Fabrication & Polishing of Silicon Carbide
Silicon Carbide (SiC) is emerging as a promising substrate for systems which leverage the low lattice mismatch with Gallium Nitride (GaN), high power density, heat dissipation and radiation hardness properties unique to this semiconductor. Wafer fabrication and polishing of SiC substrates poses processing issues as a result of the material’s high Mohs hardness (~9.25), and chemical inertness. P...
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Metal assisted photochemical etching (MAPCE) of 4H Silicon Carbide (SiC) was utilized to generate locally defined porous areas on single crystalline substrates. Therefore, Platinum (Pt) was sputter deposited on 4H-SiC substrates and patterned with photolithography and lift off. Etching was performed by immersing the Pt coated samples into an etching solution containing sodium persulphate and hy...
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ژورنال
عنوان ژورنال: Advances in Materials Science and Engineering
سال: 2018
ISSN: 1687-8434,1687-8442
DOI: 10.1155/2018/9019848